[PS-14-02] Reaction mechanisms at 4H-SiC/SiO2 interface during wet SiC oxidation
○T. Akiyama1, S. Hori1, K. Nakamura1, T. Ito1, H. Kageshima2, M. Uematsu3, K. Shiraishi4
(1.Mie Univ. (Japan), 2.Shimane Univ. (Japan), 3.Keio Univ. (Japan), 4.Nagoya Univ. (Japan))
https://doi.org/10.7567/SSDM.2017.PS-14-02