The Japan Society of Applied Physics

[PS-14-02] Reaction mechanisms at 4H-SiC/SiO2 interface during wet SiC oxidation

T. Akiyama1, S. Hori1, K. Nakamura1, T. Ito1, H. Kageshima2, M. Uematsu3, K. Shiraishi4 (1.Mie Univ. (Japan), 2.Shimane Univ. (Japan), 3.Keio Univ. (Japan), 4.Nagoya Univ. (Japan))

https://doi.org/10.7567/SSDM.2017.PS-14-02