Reliability Characteristics for Magnetic Tunnel Junctions with MgO Tunnel Barrier in Low Voltage

2017 International Conference on Solid State Devices and Materials

Sep 19, 2017 - Sep 22, 2017
Sendai International Center

11:59 AM - 12:01 PM

B. So¹,^○C. Choi¹, H. Sukegawa², S. Mitani², Y. Song¹ (1.Hanyang Univ. (Korea), 2.NIMS (Japan))