11:35 AM - 11:37 AM [PS-14-01] Observations of Inhomogeneity of 3C-SiC Layers Grown on 6H-SiC Substrates Using Scanning Internal Photoemission Microscopy ○K. Shiojima1, N. Mishina1, N. Ichikawa2, M. Kato2 (1.Univ. of Fukui (Japan), 2.Nagoya Inst. of Tech. (Japan))
