09:00 〜 09:15

[A-3-01] Study of Quantisation Accuracy Breakdown due to High Temperature and High Frequency in a Silicon Single-Electron Pump

^○N. Johnson¹, G. Yamahata¹, A. Fujiwara¹ (1.NTT Basic Research Labs (Japan))

https://doi.org/10.7567/SSDM.2018.A-3-01