11:15 AM - 11:30 AM

[B-4-02] A High-Read-Margin MTJ-Based Fracturable Lookup Table Circuit Using a Series-NMOS-Resistance-Reduced Logic-In-Memory Structure

^○D. Suzuki¹, T. Hanyu¹ (1.Tohoku University (Japan))

https://doi.org/10.7567/SSDM.2018.B-4-02