13:45 〜 14:00

[B-5-02] XPS Study of Chemical Bonding Features and Inner Potential at Y₂O₃/SiO₂ Interfaces

N. Fujimura¹,^○A. Ohta¹, M. Ikeda¹, K. Makihara¹, S. Miyazaki¹ (1.Nagoya Univ. (Japan))

https://doi.org/10.7567/SSDM.2018.B-5-02