Hot Carrier Programing Performance Study on 2T 40nm Flash Memory Cell Array For Variability Evaluation

T. Kempf

doi:https://doi.org/10.7567/SSDM.2018.B-7-03

9:45 AM - 10:00 AM

[B-7-03] Hot Carrier Programing Performance Study on 2T 40nm Flash Memory Cell Array For Variability Evaluation

^○T. Kempf^1,2,3, V. Della Marca², M. Mantelli¹, J. Postel-Pellerin², J.-M. Portal², P. Masson³, A. Regnier¹, S. Niel¹ (1.STMicroelectronics (France), 2.IM2NP Lab., Univ. of Aix-Marseille (France), 3.Polytech'Lab, Univ. of Nice Sophia-Antipolis (France))

https://doi.org/10.7567/SSDM.2018.B-7-03

2018 International Conference on Solid State Devices and Materials

[B-7-03] Hot Carrier Programing Performance Study on 2T 40nm Flash Memory Cell Array For Variability Evaluation