11:15 AM - 11:30 AM

[C-4-03] Investigation of Optimum BOX Thickness for MFIS-Type 2D Negative-Capacitance FETs

^○W.-X. You¹, P. Su¹ (1.National Chiao Tung Univ. (Taiwan))

https://doi.org/10.7567/SSDM.2018.C-4-03