The Japan Society of Applied Physics

09:30 〜 09:45

[D-7-02] Measurement of Avalanche Multiplication Factor in GaN p-n Junction Diode Using Sub-Bandgap Light Absorption Due to Franz-Keldysh Effect

T. Maeda1, T. Narita2, H. Ueda2, M. Kanechika2, T. Uesugi2, T. Kachi3, T. Kimoto1, M. Horita1, J. Suda1,3 (1.Kyoto Univ. (Japan), 2.TOYOTA Central R&D Labs., Inc. (Japan), 3.Nagoya Univ. (Japan))

https://doi.org/10.7567/SSDM.2018.D-7-02