09:30 〜 09:45

[D-7-02] Measurement of Avalanche Multiplication Factor in GaN p-n Junction Diode Using Sub-Bandgap Light Absorption Due to Franz-Keldysh Effect

^○T. Maeda¹, T. Narita², H. Ueda², M. Kanechika², T. Uesugi², T. Kachi³, T. Kimoto¹, M. Horita¹, J. Suda^1,3 (1.Kyoto Univ. (Japan), 2.TOYOTA Central R&D Labs., Inc. (Japan), 3.Nagoya Univ. (Japan))

https://doi.org/10.7567/SSDM.2018.D-7-02