11:30 〜 11:45 [E-4-04] Deep level transient spectroscopy characterization of undoped BaSi2 light absorbers ○Y. Yamashita1, T. Sato1, K. Toko1, T. Suemasu1 (1.Univ. of Tsukuba (Japan)) https://doi.org/10.7567/SSDM.2018.E-4-04