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[N-7-04] Mechanism of Negative Bias Illumination Stress in InGaZn Oxide TFTs

H. Li¹, Y. Guo²,^○J. Robertson¹ (1.Cambridge Univ. (UK), 2.Swansea Univ. (UK))

https://doi.org/10.7567/SSDM.2018.N-7-04