09:45 〜 10:00

[N-7-04] Mechanism of Negative Bias Illumination Stress in InGaZn Oxide TFTs

H. Li¹, Y. Guo²,^○J. Robertson¹ (1.Cambridge Univ. (UK), 2.Swansea Univ. (UK))

https://doi.org/10.7567/SSDM.2018.N-7-04