11:00 〜 13:30

[PS-1-26 (Late News)] Read Static Noise Margin Fluctuation Induced by Various Random Discrete Dopants on 6T SRAM with Nanowire FET (NWFET) and Hybrid FinFET-NWFET Cells

^○W.L. Sung¹, Y. Li¹ (1.National Chiao Tung University (Taiwan))

https://doi.org/10.7567/SSDM.2018.PS-1-26