11:00 〜 13:30

[PS-4-07 (Late News)] Investigation on Parasitic Loss at the AlN/Si Interface for GaN-HEMTs Application

^○Y.H. Chen¹, T.T. Luong¹, V. Nagarajan¹, T.H. Chiang¹, E.Y. Chang¹ (1.National Chiao Tung University (Taiwan))

https://doi.org/10.7567/SSDM.2018.PS-4-07