2018 International Conference on Solid State Devices and Materials

Sep 9, 2018 - Sep 13, 2018
University of Tokyo

4:36 PM - 4:37 PM

[PS-1-07] Stochastic Simulation of Breakdown Process for High-k Dielectrics

^○W. Liu¹, B. Chen¹, S. Gao¹, Z. Zheng¹, Y. Zhao¹ (1.Zhejiang Univ. (China))

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