The Japan Society of Applied Physics

16:40 〜 16:41

[PS-1-11] Performance Analysis of Gate-All-Around Negative Capacitance Stacked Nanowire and Negative Capacitance Nanosheet FETs

Z.T. Lin1, P.C. Chiu1, V.P.H. Hu1 (1.National Central Univ. (Taiwan))