2018 International Conference on Solid State Devices and Materials
Sep 9, 2018 - Sep 13, 2018 University of Tokyo
5:00 PM - 5:01 PM
[PS-1-31 (Late News)] Consideration on the effective dipole length in Al2O3/SiO2 and Y2O3/SiO2 interface dipole layers via temperature dependences of their dipole strength
○S. Nittayakasetwat1, K. Kita1 (1.Univ. of Tokyo (Japan))
