16:43 〜 16:44
[PS-10-14] Wafer-Level-Probing Electrical Properties of Planar Junctionless Poly-Si Thin-Film Transistors Using a Novel C-V Charcacterization Scheme
○C.M. Chuang1, K.P. Peng1, Y.T. Chang1, H.C. Lin1, P.W. Li1
(1.National Chiao Tung Univ. (Taiwan))