2018 International Conference on Solid State Devices and Materials

Sep 9, 2018 - Sep 13, 2018
University of Tokyo

4:55 PM - 4:56 PM

[PS-3-07] Mapping of Ni/SiN_x/n-SiC Structure Using Scanning Internal Photoemission Microscopy

^○K. Shiojima¹, T. Hashizume¹, M. Sato², M.B. Takeyama² (1.Univ. of Fukui (Japan), 2.Kitami Inst. of Tech. (Japan))

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