The Japan Society of Applied Physics

4:34 PM - 4:35 PM

[PS-4-05] Low Ohmic Contact Resistance on AlGaN/GaN Heterostructures Based on Ti/Al/Ti/TiN Metal Stacks

H. Sun1, J. Chen2, P. Liu1, D. Chen1 (1.Peking University (China), 2.Founder Microelectronics International Co., Ltd. (China))