The Japan Society of Applied Physics

10:00 〜 10:15

[F-5-05 (Late News)] Analysis of Inclined Threading Dislocation from GaN [0001] by Raman mapping

N. Kokubo1,2, S. Inotsume1,2, Y. Tsunooka1,2, F. Fujie1, J. Ohara1, S. Onda1, H. Yamada2, M. Shimizu1,2, S. Harada1, M. Tagawa1, T. Ujihara1,2 (1.Nagoya Univ. (Japan), 2.AIST (Japan))

https://doi.org/10.7567/SSDM.2019.F-5-05