16:45 〜 17:00
[H-2-05] Memory Window and Endurance Improvement of HfZrO Based FeFETs with ZrO2 Seed Layers
○W. Xiao1, C. Liu1, Y. Peng2, S. Zheng1, C. Zhang2, J. Zhang2, Y. Hao2, M. Liao1, Y. Zhou1
(1.Xiangtan Univ. (China), 2.Xidian Univ. (China))
https://doi.org/10.7567/SSDM.2019.H-2-05