The Japan Society of Applied Physics

11:00 〜 11:15

[J-6-02] Uniformity Characterization of Printed Schottky Contacts Formed on n-GaN Epitaxial Layers by Using Ag Nanoink

K. Shiojima1, Y. Kashiwagi2, A. Koizumi3, M. Saitoh2, T. Tamai2, Y. Fujiwara3 (1.Univ. of Fukui (Japan), 2.Osaka Res. Insti. of Indus. Sci. and Tech. (Japan), 3.Osaka Univ. (Japan))

https://doi.org/10.7567/SSDM.2019.J-6-02