1:45 PM - 2:00 PM

[K-7-03] Characterization of Ni/GaN(0001) Interfaces by Photoemission Measurements

^○K. Watanabe¹, A. Ohta¹, N. Taoka¹, H. Yamada², M. Ikeda¹, K. Makihara¹, M. Shimizu², S. Miyazaki¹ (1.Nagoya Univ. (Japan), 2.AIST GaN-OIL. (Japan))

https://doi.org/10.7567/SSDM.2019.K-7-03