16:30 〜 16:45

[M-4-05 (Late News)] An Accuracy Improved Resistance Measurement Platform For Evaluation of Emerging Memory Materials

^○T. Maeda¹, Y. Omura¹, R. Kuroda¹, A. Teramoto¹, T. Suwa¹, S. Sugawa¹ (1.Tohoku Univ. (Japan))

https://doi.org/10.7567/SSDM.2019.M-4-05