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[PS-2-06] Optimal Bias Condition of Dummy WL for Sub-Block Erase Operation in 3D NAND Flash Memory

^○Y. Jeong¹, I. Ham¹, M. Kang¹ (1.Korea National Univ. of Transportation (Korea))

https://doi.org/10.7567/SSDM.2019.PS-2-06