The Japan Society of Applied Physics

13:00 〜 15:00

[PS-2-07] Hot Carrier Injection Phenomenon due to Excessive Natural Local Self-Boosting Effect in 3D NAND Flash Memory

Y. Jeong1,I. Ham1, S.J. Baik2, M. Kang1 (1.Korea National Univ. of Transportation (Korea), 2.Hankyong National Univ. (Korea))

https://doi.org/10.7567/SSDM.2019.PS-2-07