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[PS-2-07] Hot Carrier Injection Phenomenon due to Excessive Natural Local Self-Boosting Effect in 3D NAND Flash Memory

Y. Jeong¹,^○I. Ham¹, S.J. Baik², M. Kang¹ (1.Korea National Univ. of Transportation (Korea), 2.Hankyong National Univ. (Korea))

https://doi.org/10.7567/SSDM.2019.PS-2-07