Integrated Simulation Methodology for EM-induced Circuit Degradation

Y. Xiao

doi:https://doi.org/10.7567/SSDM.2019.PS-3-02

13:00 〜 15:00

[PS-3-02] Integrated Simulation Methodology for EM-induced Circuit Degradation

^○Y. Xiao¹, H. Jiang¹, Z. Ahmed¹, Z. Ma¹, C. Prawoto¹, C.J. Estrada¹, L. Zhang², M. Chan¹ (1.The Hong Kong Univ. of Sci. and Tech. (Hong Kong), 2.Shenzhen Univ. (China))

https://doi.org/10.7567/SSDM.2019.PS-3-02

2019 International Conference on Solid State Devices and Materials

[PS-3-02] Integrated Simulation Methodology for EM-induced Circuit Degradation