The Japan Society of Applied Physics

13:00 〜 15:00

[PS-4-26 (Late News)] Modeling of the Leakage Current in GaN mediated through the Dislocation-Impurity Complex

Y. Harashima1, T. Nakano2, A. Oshiyama1, K. Shiraishi1,2 (1.IMaSS, Nagoya Univ. (Japan), 2.Department of Eng., Nagoya Univ. (Japan))

https://doi.org/10.7567/SSDM.2019.PS-4-26