1:00 PM - 3:00 PM [PS-4-27 (Late News)] High current turn-off capability testing of a 3.3 kV SiC-MOSFET ○K. Takao1, T. Sakano1, Y. Hayashi1, S. Hongliang1 (1.Toshiba Corporation (Japan)) https://doi.org/10.7567/SSDM.2019.PS-4-27