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[PS-4-29 (Late News)] Cumulative Effects of Gamma Irradiation on Oxide Traps and Interface States in SiC MOS Capacitor

^○Y.-X. Lin¹, D.-S. Chao², J.-H. Liang^1,3, J.-Y. Jiang⁴, C.-F. Huang⁴ (1.Department of Eng. and System Sci., National Tsing Hua Univ. (Taiwan), 2.Nuclear Sci. and Tech. Development Center, National Tsing Hua Univ. (Taiwan), 3.Inst. of Nuclear Eng. and Sci., National Tsing Hua Univ. (Taiwan), 4.Inst. of Electronics Eng., National Tsing Hua Univ. (Taiwan))

https://doi.org/10.7567/SSDM.2019.PS-4-29