Metal-insulator Transition Field Effect Transistor Observed by 4-probe Lamination Contact Electrode

M. Sakai

doi:https://doi.org/10.7567/SSDM.2019.PS-7-01

1:00 PM - 3:00 PM

[PS-7-01] Metal-insulator Transition Field Effect Transistor Observed by 4-probe Lamination Contact Electrode

^○M. Sakai¹, Y. Okada², T. Ueda¹, T. Sano¹, R. Takeda¹, K. Kudo¹, H. Masu³ (1.Dept. of Electrical and Electronic Eng., Chiba Univ. (Japan), 2.Center for Frontier Science, Chiba Univ. (Japan), 3.Center for Analytical Instrumentation, Chiba Univ. (Japan))

https://doi.org/10.7567/SSDM.2019.PS-7-01

2019 International Conference on Solid State Devices and Materials

[PS-7-01] Metal-insulator Transition Field Effect Transistor Observed by 4-probe Lamination Contact Electrode