Kelvin probe study of energy level bending at interface of solution-processed alkyl-substituted phthalocyanine thin film and n-Si substrate

13:00 〜 15:00

[PS-7-08] Kelvin probe study of energy level bending at interface of solution-processed alkyl-substituted phthalocyanine thin film and n-Si substrate

^○R. Ishiura¹, A. Fujii¹, M. Arita², K. Sudoh¹, M. Ozaki¹ (1.Osaka Univ. (Japan), 2.Kyushu Univ. (Japan))