10:53 AM - 10:55 AM
[PS-1-05] Characteristic Variability and Random Telegraph Noise of Gate-All-Around Silicon Nanowire MOSFETs with Asymmetric Dual Spacer Induced by Single Charge Trap
○S.R. Kola1, Y. Li1, N. Thoti1, C.-Y. Chen1, W.-L. Sung1
(1.National Chiao Tung Univ. (Taiwan))