11:19 〜 11:21
[PS-1-18] Memory window and retention time of double back gate Z2-FET
○Y. Kim1, S. Kwon2, F. Gamiz3, P. Galy5, S. Cristolovenau4
(1.KIST (Korea), 2.Univ. of Hanyang (Korea), 3.Univ. of Granada (Spain), 4.INPG (France), 5.STMicron (France))