11:03 〜 11:05 [PS-10-10] Characterization of Asymmetry in Ni-Seed-Induced Laterally Crystallized (SILC) TFTs by Bew Gate-Floating-Drain-Current (GFDC) Method ○C.C. Chung1, L.C. Liu1, T.S. Chao1 (1.National Chiao Tung Univ. (Taiwan))
