10:57 〜 10:59

[PS-2-07] Hot Carrier Injection Phenomenon due to Excessive Natural Local Self-Boosting Effect in 3D NAND Flash Memory

Y. Jeong¹,^○I. Ham¹, S.J. Baik², M. Kang¹ (1.Korea National Univ. of Transportation (Korea), 2.Hankyong National Univ. (Korea))