Failure and Recovery of Double-Layer CBRAM Studied by <i>In-Situ</i> TEM

M. Arita

2019 International Conference on Solid State Devices and Materials

Sep 2, 2019 - Sep 5, 2019
Nagoya University

11:15 AM - 11:17 AM

[PS-2-16] Failure and Recovery of Double-Layer CBRAM Studied by In-Situ TEM

^○M. Arita¹, R. Ishikawa¹, K. Arima¹, A. Tsurumaki-Fukuchi¹, Y. Takahashi¹, M. Kudo², S. Matsumura² (1.Hokkaido Univ. (Japan), 2.Kyushu Univ. (Japan))

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