11:35 AM - 11:37 AM
[PS-4-26 (Late News)] Modeling of the Leakage Current in GaN mediated through the Dislocation-Impurity Complex
○Y. Harashima1, T. Nakano2, A. Oshiyama1, K. Shiraishi1,2
(1.IMaSS, Nagoya Univ. (Japan), 2.Department of Eng., Nagoya Univ. (Japan))