10:00 AM - 10:15 AM
[A-3-04] New Observation and Mechanism of Flicker Noise and Random Telegraph Noise in Sub-40nm SiC Strained nMOSFETs
〇Jyh-Chyurn Guo1, Adhi Cahyo Wijaya1, Jinq-Min Lin1
(1. National Chiao-Tung University(Taiwan))
https://doi.org/10.7567/SSDM.2020.A-3-04