10:00 AM - 10:15 AM

[A-3-04] New Observation and Mechanism of Flicker Noise and Random Telegraph Noise in Sub-40nm SiC Strained nMOSFETs

〇Jyh-Chyurn Guo¹, Adhi Cahyo Wijaya¹, Jinq-Min Lin¹ (1. National Chiao-Tung University(Taiwan))

https://doi.org/10.7567/SSDM.2020.A-3-04