White Spots Caused by Junction Leakage in Small Pixels of CMOS Image Sensor

Jeongjin Cho

doi:https://doi.org/10.7567/SSDM.2020.A-4-05

12:15 PM - 12:30 PM

[A-4-05] White Spots Caused by Junction Leakage in Small Pixels of CMOS Image Sensor

〇Jeongjin Cho¹, Minji Jung¹, Taesub Jung¹, Masato Fujita¹, Kyungho Lee¹, Youjin Jung¹, Sungmin Ahn¹, Howoo Park², Dukseo Park², Younguk Song², Takashi Nagano¹, JungChak Ahn¹, Yongin Park¹ (1. System LSI Division, Samsung Electronics Co., Ltd(Korea), 2. Foundry Division, Samsung Electronics Co., Ltd(Korea))

https://doi.org/10.7567/SSDM.2020.A-4-05

2020 International Conference on Solid State Devices and Materials

[A-4-05] White Spots Caused by Junction Leakage in Small Pixels of CMOS Image Sensor