17:15 〜 17:30

[B-10-05] In situ TEM Observation of CBRAMs during Digital and Analog Switching

〇Satoshi Muto¹, Tsutomu Nakajima¹, Atushi Tsurumaki-Fukuchi¹, Masashi Arita¹, Yasuo Takahashi¹ (1. Hokkaido Univ.(Japan))

https://doi.org/10.7567/SSDM.2020.B-10-05