5:30 PM - 5:45 PM

[B-2-06] Variability Analysis for Ferroelectric FET Nonvolatile Memories Considering Fluctuations due to Trapped Charges

〇You Sheng Liu¹, Pin Su¹ (1. National Chiao Tung University(Taiwan))

https://doi.org/10.7567/SSDM.2020.B-2-06