Impact and Solution of Nonlinear Characteristics of Resistive Memory in Analog Computing-in-memory Architecture for Deep Neural Network

YuHsuan Lin

doi:https://doi.org/10.7567/SSDM.2020.B-9-02

14:30 〜 14:45

[B-9-02] Impact and Solution of Nonlinear Characteristics of Resistive Memory in Analog Computing-in-memory Architecture for Deep Neural Network

〇YuHsuan Lin¹, PoKai Hsu¹, DaiYing Lee¹, MingHsiu Lee¹, HsiangLan Lung¹, KuangYeu Hsieh¹, KehChung Wang¹, ChihYuan Lu¹ (1. Macronix International Co., Ltd.(Taiwan))

https://doi.org/10.7567/SSDM.2020.B-9-02

2020 International Conference on Solid State Devices and Materials

[B-9-02] Impact and Solution of Nonlinear Characteristics of Resistive Memory in Analog Computing-in-memory Architecture for Deep Neural Network