5:00 PM - 5:15 PM

[D-2-04] On-resistance and Breakdown-Phenomenon Dependences on Threading Dislocations in Vertical p-n Junction Diodes

〇Hiroshi - Ohta¹, Naomi - Asai¹, Fumimasa - Horikiri², Yoshinobu - Narita², Takehiro - Yoshida², Tomoyoshi - Mishima¹ (1. Hosei Univ.(Japan), 2. SCIOCS Co., Ltd.(Japan))

https://doi.org/10.7567/SSDM.2020.D-2-04