The Japan Society of Applied Physics

14:45 〜 15:00

[D-5-04] Study of Leakage Mechanisms in III-V Nano-ridge diode on Silicon

〇Olga - Syshchyk1,2, Vasyl - Motsnyi2, Renaud Puybaret2, Jiwon Lee2, Gauri Karve2, Bob Puers1, Chris Van Hoof1,2 (1. KU Leuven, Belgium(Belgium), 2. Interuniversity Microelectronics Center (IMEC)(Belgium))

https://doi.org/10.7567/SSDM.2020.D-5-04