14:45 〜 15:00

[D-9-04] Investigation of Acceptable Breakdown Voltage Variation for Parallel-Connected SiC-MOSFET during UIS Test

〇Zaiqi Lou¹, Wataru Saito¹, Shin-ichi Nishizawa¹ (1. Kyushu Univ.(Japan))

https://doi.org/10.7567/SSDM.2020.D-9-04